MMSD-12-20-L-03.25-D-K-LUS

Samtec, Inc. MMSD-12-20-L-03.25-D-K-LUS

Part No:

MMSD-12-20-L-03.25-D-K-LUS

Manufacturer:

Samtec, Inc.

Datasheet:

-

Package:

-

AINNX NO:

31229386-MMSD-12-20-L-03.25-D-K-LUS

Description:

Rectangular Cable Assemblies Mini-Mate Cable Assembly, 0.100 Pitch

Products specifications
  • Lifecycle Status
    Production (Last Updated: 1 year ago)
  • Factory Lead Time
    2 Weeks
  • Number of Pins
    24
  • RoHS
    Details
  • Connector End A
    Socket
  • Connector End A Pin Count
    24 Position
  • Connector End B
    Socket
  • Connector End B Pin Count
    24 Position
  • Voltage, Rating
    300 VAC
  • Jacket Material
    Polyvinyl Chloride (PVC)
  • Factory Pack QuantityFactory Pack Quantity
    1
  • Tradename
    Mini Mate
  • Manufacturer Lifecycle Status
    PRODUCTION (Last Updated: 1 year ago)
  • Package Description
    ROHS COMPLIANT
  • Rohs Code
    Yes
  • Manufacturer Part Number
    MMSD-12-20-L-03.25-D-K-LUS
  • Part Life Cycle Code
    Active
  • Ihs Manufacturer
    SAMTEC INC
  • Risk Rank
    5.57
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Bulk
  • Series
    MMSD
  • JESD-609 Code
    e3
  • Termination
    Crimp
  • Connector Type
    Discrete Wire
  • Type
    Double Row PVC Cable
  • Gender
    Female / Female
  • Pitch
    2.54 mm
  • Reach Compliance Code
    compliant
  • Current Rating

    Current rating is the maximum current that a fuse will carry for an indefinite period without too much deterioration of the fuse element.

    4.8 A
  • Wire/Cable Type
    Discrete
  • Cable Length

    A nautical unit of measure equal to one tenth of a nautical mile or approximately 1 fathoms.

    82.6 mm
  • Contact Finish Termination
    Tin (Sn)
  • Product
    Discrete Wire Cable Assemblies
  • Wire Gauge - AWG
    20 AWG
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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