VNV10N07TR-E

STMicroelectronics VNV10N07TR-E

Part No:

VNV10N07TR-E

Manufacturer:

STMicroelectronics

Package:

-

ROHS:

AINNX NO:

13336446-VNV10N07TR-E

Description:

IC PWR MOSFET M0 70V 10A PWRSO10

Products specifications
  • Lifecycle Status
    NRND (Last Updated: 7 months ago)
  • Mount
    Surface Mount
  • Number of Pins
    10
  • Power Dissipation (Max)
    50W
  • Published
    2013
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Tape & Reel (TR)
  • Part Status

    Parts can have many statuses as they progress through the configuration, analysis, review, and approval stages.

    Active
  • Resistance
    100mOhm
  • Number of Outputs
    1
  • Max Output Current

    The maximum current that can be supplied to the load.

    7A
  • Operating Supply Voltage

    The voltage level by which an electrical system is designated and to which certain operating characteristics of the system are related.

    18V
  • Interface
    On/Off
  • Nominal Supply Current

    Nominal current is the same as the rated current. It is the current drawn by the motor while delivering rated mechanical output at its shaft.

    250μA
  • Output Configuration
    Low Side
  • Power Dissipation

    the process by which an electronic or electrical device produces heat (energy loss or waste) as an undesirable derivative of its primary action.

    50W
  • Max Supply Current
    250μA
  • Current - Output
    7A
  • Fault Protection

    Protection against electric shock under. single fault conditions.

    Over Temperature, Over Voltage
  • RoHS Status

    RoHS means “Restriction of Certain Hazardous Substances” in the “Hazardous Substances Directive” in electrical and electronic equipment.

    RoHS Compliant
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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