2-1393565-1

TE Connectivity 2-1393565-1

Part No:

2-1393565-1

Manufacturer:

TE Connectivity

Datasheet:

-

Package:

-

AINNX NO:

37103254-2-1393565-1

Description:

Ribbon Cable Connectors

Products specifications
  • Lifecycle Status
    Production (Last Updated: 3 months ago)
  • Mount
    Cable, Socket
  • Harmonized Code
    37174000
  • ECCN
    EAR99
  • Itar Registered
    Unavailable
  • Body Orientation
    Straight
  • Product Depth (mm)
    Not Required(mm)
  • Product Diameter (mm)
    6.5(mm)
  • For Use With
    AMP Wire-to-Board Connectors
  • Unit Weight
    0.194360 oz
  • Factory Pack QuantityFactory Pack Quantity
    50
  • Manufacturer
    TE Connectivity
  • Brand
    TE Connectivity
  • Tradename
    AMP-LATCH
  • RoHS
    Details
  • Filtered
    -
  • Manufacturer Lifecycle Status
    ACTIVE (Last Updated: 3 months ago)
  • Series
    AMP-LATCH
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Bulk
  • Type
    Socket
  • Gender
    Female
  • Subcategory
    D-Sub Connectors
  • Orientation
    Straight
  • Accessory Type
    Jack Screw
  • Product Type

    a group of products which fulfill a similar need for a market segment or market as a whole.

    D-Sub Tools & Hardware
  • Product
    Hardware
  • Product Category

    a particular group of related products.

    D-Sub Tools & Hardware
  • IP Rating

    IP (or "Ingress Protection") ratings are defined in international standard EN 6529 (British BS EN 6529:1992, European IEC 659:1989). They are?used to define levels of sealing effectiveness of electrical enclosures against intrusion from foreign bodies?(tools, dirt etc) and moisture.

    -
  • Product Length (mm)
    19.5(mm)
  • Length
    19.5 mm
  • Product Height (mm)
    Not Required(mm)
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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