TriQuint CLY5

Surface Mount

having leads that are designed to be soldered on the side of a circuit board that the body of the component is mounted on.

YES

Mount

Surface Mount

Number of Pins

4

Weight

188.014037 mg

Number of Terminals

4

Transistor Element Material

GALLIUM ARSENIDE

Package Shape

RECTANGULAR

Package Style

SMALL OUTLINE

Reflow Temperature-Max (s)

30

Package Body Material

PLASTIC/EPOXY

Number of Elements

1

Drain Current-Max (ID)

1.2 A

Risk Rank

5.34

Package Description

SMALL OUTLINE, R-PDSO-G4

Ihs Manufacturer

QORVO INC

Part Life Cycle Code

Obsolete

Rohs Code

Yes

Manufacturer Part Number

CLY5

RoHS

Compliant

ECCN Code

EAR99

Max Operating Temperature

The Maximum Operating Temperature is the maximum body temperature at which the thermistor is designed to operate for extended periods of time with acceptable stability of its electrical characteristics.

150 °C

Min Operating Temperature

-55 °C

Max Power Dissipation

The maximum power that the MOSFET can dissipate continuously under the specified thermal conditions.

2 W

Terminal Position

DUAL

Terminal Form

Occurring at or forming the end of a series, succession, or the like; closing; concluding.

GULL WING

Peak Reflow Temperature (Cel)

260

Reach Compliance Code

compliant

Frequency

1.8 GHz

JESD-30 Code

R-PDSO-G4

Qualification Status

An indicator of formal certification of qualifications.

Not Qualified

Configuration

SINGLE

Operating Mode

A phase of operation during the operation and maintenance stages of the life cycle of a facility.

DEPLETION MODE

Case Connection

SOURCE

Transistor Application

AMPLIFIER

Drain to Source Voltage (Vdss)

9 V

Polarity/Channel Type

N-CHANNEL

Continuous Drain Current (ID)

1.2 A

Gate to Source Voltage (Vgs)

-6 V

Gain

9.5 dB

DS Breakdown Voltage-Min

9 V

FET Technology

JUNCTION

Highest Frequency Band

S BAND

Power Gain-Min (Gp)

9 dB

Radiation Hardening

Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

No