BCR 189T E6327

International Rectifier BCR 189T E6327

Part No:

BCR 189T E6327

Datasheet:

-

Package:

SC-75, SOT-416

AINNX NO:

40844326-BCR 189T E6327

Description:

Products specifications
  • Mount
    Flanges
  • Mounting Type
    Surface Mount
  • Package / Case
    SC-75, SOT-416
  • Supplier Device Package
    PG-SC-75
  • Approvals
    ENEC, cULus
  • Voltage Rating (DC)
    300 V
  • Voltage Rating (AC)
    520 V
  • RoHS
    Compliant
  • Lead Free Status / RoHS Status
    Lead free / RoHS Compliant
  • Current-Collector (Ic) (Max)
    100mA
  • Other Names
    BCR 189T E6327-ND BCR189TE6327 BCR189TE6327XT SP000014818
  • Series
    -
  • Packaging

    Semiconductor package is a carrier / shell used to contain and cover one or more semiconductor components or integrated circuits. The material of the shell can be metal, plastic, glass or ceramic.

    Tape & Reel (TR)
  • Moisture Sensitivity Level (MSL)
    1 (Unlimited)
  • Termination
    Terminal Block
  • Depth
    351 mm
  • Current Rating

    Current rating is the maximum current that a fuse will carry for an indefinite period without too much deterioration of the fuse element.

    150 A
  • Frequency
    60 Hz
  • Leakage Current
    3.5 mA
  • Max Voltage Rating (AC)
    520 V
  • Max Current Rating
    150 A
  • Power - Max
    250mW
  • Transistor Type
    PNP - Pre-Biased
  • DC Current Gain (hFE) (Min) @ Ic, Vce
    120 @ 5mA, 5V
  • Current - Collector Cutoff (Max)
    100nA (ICBO)
  • Vce Saturation (Max) @ Ib, Ic
    300mV @ 500µA, 10mA
  • Voltage - Collector Emitter Breakdown (Max)
    50V
  • Frequency - Transition
    200MHz
  • Resistor - Base (R1)
    22 kOhms
  • Height
    130 mm
  • Length
    160 mm
  • Radiation Hardening

    Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation, especially for environments in outer space (especially beyond the low Earth orbit), around nuclear reactors and particle accelerators, or during nuclear accidents or nuclear warfare.

    No
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